Measurement of thin films is critical in industries where precise thickness determination is essential for performance and quality control. The thin film bundle streamlines this process, from acquiring data to processing results, ensuring efficiency and accuracy in every measurement. This bundle was especially designed for single-layer thin film measurements. The setup can measure thin films ranging from 10 nm up to 50 µm, with a resolution of 1 nm, and supports UV, VIS, and NIR measurements from 200 up to 1100 nm.
Typical applications:
• Semi-conductor industry
• Solar panels
• Coatings
Thin Film Bundle Components:
• Spectrometer: Designed for high-resolution spectral analysis in the wavelength range of 200 – 1100 nm.
• Light Source: Provides stable and broad-spectrum illumination essential for thin film reflectance measurements.
• Fiber Optics: Reflection probe that facilitates precise light transmission and collection for reflective measurements on thin film surfaces.
• Accessories: Includes fixturing stage for stable positioning and measurement consistency across samples, and reference standard including samples of both uncoated and coated substrates for validation and calibration purposes.
• Software: AvaSoft-All which enables quick and accurate measurements and analysis of single-layer thin films. Provides thickness values and fit quality assessment.
Example Bundle Setup:
Customizable Options
Every measurement task is unique, and our modular system allows you to tailor the spectrometer setup to your specific needs. Contact us to discuss how we can help you configure the ideal measurement setup for your application.