This bundle was especially designed for single layer thin film measurements, with a light source, a reflection probe and a stage and standard included. The setup can measure thin films ranging from 10 nm up to 50 µm with a resolution of 1 nm and supports UV, VIS and NIR measurements from 200 up to 1100 nm.
• Semi-conductor industry
• Solar panels
|Spectrometer||AvaSpec-ULS2048CL-EVO||Grating UA (200-1100 nm); 100 μm slit; DCL-UV/VIS-200; OSC-UA; AvaSoft-Thinfilm|
|Included||Thin film stage & standard|