Bundle: Thin film measurement

Bundle: Thin film measurement
 
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This bundle was especially designed for single layer thin film measurements, with a light source, a reflection probe and a stage and standard included. The setup can measure thin films ranging from 10 nm up to 50 µm with a resolution of 1 nm and supports UV, VIS and NIR measurements from 200 up to 1100 nm. 

Typical applications:

• Semi-conductor industry
• Solar panels
• Coatings

Contents

Spectrometer

AvaSpec-ULS2048CL-EVO

Grating UA (200-1100 nm)
100 μm slit
DCL-UV/VIS-200
OSC-UA 
AvaSoft-Thinfilm

Light source

Avalight-DHc

 PS-12V/1.0A 

Fiber optics

FCR-7UVIR200-2-ME

 

Included

ThinFilm stage & standard